The Laboratory is equipped with specialized scientific and research equipment, including:

Technological equipment:
- a station for vacuum deposition of thin films by evaporation (Balzers),
- a station for vacuum deposition of thin films using the IBAD method (SHINKU KIKAI KOGYO Co. Ltd.),
- a station for vacuum deposition of thin films using the BARE method (NP-500),
- a station for vacuum deposition of thin films by magnetron sputtering (NP-500),
- a station for vacuum deposition of gradient thin films using magnetron sputtering (patented in-house design),
- power supply systems (Dora Power System - 5; 7; 10; 15kW) of magnetron guns: DC, MF (100kHz), pulsed-dc (110kHz),
- Nabertherm tubular furnace with maximum annealing temperature of 1100 °C with the possibility of heating samples in a controlled atmosphere, i.e. in oxidizing, inert or reducing gases,
- a station for the preparation of nanopowders with the chemical method,
- laminar chamber for the preparation of substrates and samples for PVD processes,
- station for plasma modification of polymer substrates in the air,
- a station for the deposition of thin films using the spin-coating method,
- dryer for nanopowders and thin-film coatings,
- a station for washing the substrates and laboratory glasses;

Diagnostic and research equipment:
- OES optical emission spectroscopy systems (300 ÷ 800 nm),
- station for interference thickness measurements of thin films,
- station for measuring the I-V characteristics of field emitters,
- scanning electron microscopes: JSM-35 (by JEOL) with equipment for 3D imaging, JSM-840 (JEOL) with equipment for 3D imaging in low vacuum (dielectrics, hydrated objects),
- stand for measuring the transmission, reflection and absorbance of light (in the spectral range 200 ÷ 2500 nm) on the optical table - 2 Ocean Optics spectrophotometers (NIR 256 and QE 65000), DH-BAL 2000 light source,
- stand for testing the spectral sensitivity and photoluminescence characteristics (in the spectral range 200 ÷ 1300 nm) on the optical table, equipped with an XE 450 lamp and 2 Optel monochromators,
- current-voltage characterograph with measuring station and Faraday cage - Keithley 4200-SCS Semiconductor Characterization System, Cascade Microtech M150,
- impedance analyzer - Agilent 4294A,
- stand for electrical tests with the four-point probe method and for measurements with the Hall method - JANDEL probe, Keithley 2611 SourceMeter system,
- workshop workstation in the field of electronic assembly,
- specialized nitrogen-helium cryostat - chamber for testing gaso-, electro-, thermo- and photochromic effects - JANIS Research Co. Inc .,
- a chamber for testing the thermal properties of fire-resistant / fireproof optical coatings,
- a stand for testing thermoelectric properties (determination of the type of conductivity),
- optical coating design and analysis station - FTG FilmStar, Scout software,
- a stand for testing antistatic properties with a climatic chamber - John Chubb Instrumentation,
- a stand for testing the geometrical structure of the surface and the thickness of optical coatings - Taylor Hobson Talysurf CCI Lite,
- optical transmission-reflection microscope with a digital imaging system - Olympus BX51,
- a stand for testing the scratch resistance of optical coatings - Summers Optical,
- a stand for testing the wettability of thin films - Attension Theta Lite,
- Bayer abrasion resistance tester,
- a stand for testing the photocatalytic activity of thin-film coatings and nanopowders,
- stand for testing absorbance spectra,
- a station for photoconductive measurements using a focused light beam (LBIC),
- a system for measuring the I-V characteristics of solar cells with dimensions up to 10x10 cm under changing conditions of light intensity and temperature (~ 20 - 60 ° C, water thermostat) with a own-invented software,
- system for measuring the I-V characteristics of solar cells with dimensions up to 156x156 cm under variable conditions of light intensity and temperature (~ 0 - 60 °C, Peltier cell system); voltage measurement range -10 - +10 V, current ~ ± 1 mA - ± 20 A. The system enables the determination of temperature coefficients of current, voltage and power as well as determination of parameters for several electrical versions of substitute diode models of a cell (SEM, DEM and VDEM); the system is equipped with a solar light simulator of class A (IEC 60904-9) prod. Yamashita Denso (Japan); own-invented software; the possibility of changing the light intensity in the range of over 3 orders of magnitude (<1 W/m² - ~ 1100 W/m²),
- system for measuring the characteristics of cells and PV modules of all types in the range of ± 120 V and ± 2.5 A or ± 60 V and ± 10 A (min. measured current ~ 10-8 A). The software enables parameter determination for several versions of the electric diode replacement cell models (SEM, DEM and VDEM); proprietary software,
- a cabinet (manufactured by Steuernagel Lichttechnik) for measuring the I-V characteristics of PV modules with dimensions up to 0.5 - 1 m. Light source - halogen lighting system with a power of ~ 7.2 kW; proprietary software,
- climatic cabinet (used for "dark" measurements) with the possibility of temperature changes in the range of ~ -40^oC to + 85^oC, equipped with cabling enabling correct measurements of "dark" I-V characteristics (and their temperature) in situ simultaneously up to 10 PV modules,
- SPI-Laminator 240 laminator by Spire - lamination of PV modules with dimensions of ~ 60-120 cm,
- two stands for long-term continuous testing of PV modules in natural conditions and a weather station; own software (database) made in the SAS system,
- cell and PV module design and modeling software (Solar Design Studio and BlueSol, SolarFit, EasyFit, SolarSpectrum, IVTranslation.