Members of the Division of Thin Film Technology (Prof. Michał Mazur, Prof. Damian Wojcieszak, Wiktoria Weichbrodt and Paulina Kapuścik) just wrapped up a productive five-day research stay at the Institute of Thin Films, Sensors & Imaging at the University of the West of Scotland, hosted by Prof. Des Gibson.

Our visit focused on comprehensive characterization of metal oxide thin films developed in our labs. We carried out advanced measurements, including X-ray diffraction, Raman and FTIR spectroscopy, scanning electron microscopy, and optical measurements. Additionally, we began collaborative deposition of new WOx films using the facilities at the Institute of Thin Films, Sensors & Imaging, further strengthening our joint efforts in thin film research.

This collaboration strengthens our shared interest in designing efficient sensing materials and understanding their behavior at the microscopic level. We're grateful for the technical exchange, inspiring conversations, and warm hospitality.

Looking forward to continued collaboration!